JEOL USA , Inc.
About JEOL USA , Inc.
• SEM: Ultrahigh resolution, analytical FE SEMs, benchtop SEMs, and an award-winning correlative microscope. JEOL recently introduced a portable analytical SEM with unique multi-touch control.
• TEM: LV instruments for biology, pathology, and cryo-tomography in addition to high resolution instruments for materials science, cryo EM, and tomography. New atomic resolution microscope with CFEG is unprecedented in the industry with 78 pm resolution.
• Sample Preparation: Unique tools for pristine cross sections of SEM & TEM samples plus FIB tool for nanometric fabrication & sample prep.
• Microprobes: EPMA microprobes, Auger microanalyzers, & Photoelectron Spectrometers for in-depth surface analysis with ultrahigh spatial resolution.
• EBeam Lithography: From mask production tools to direct write ebeam systems. More than 40 years of expertise.
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